Title :
An envelope domain measurement test setup to acquire linear scattering parameters
Author :
Zenteno, Efrain ; Isaksson, Magnus ; Wisell, D. ; Keskitalo, Niclas ; Andersen, Olav
Author_Institution :
Center for RF Meas. Technol., Univ. of Gavle, Gavle
Abstract :
In this paper, the functionality of a vector network analyzer VNA is implemented using the concept of software defined measurements (SDM) [1], called SDM-VNA. A general measurement set-up based on a vector signal generator (VSG) and a vector signal analyzer (VSA) is used. The set-up allows complete linear characterization using only one receiver. A calibration procedure to remove the systematic errors is applied to the results and compared with a modern VNA, showing good agreement.
Keywords :
S-parameters; calibration; computerised instrumentation; measurement errors; network analysers; signal generators; S-parameters; SDM-VNA; calibration procedure; envelope domain measurement test setup; linear scattering parameters; software defined measurements; systematic errors; vector network analyzer; vector signal analyzer; vector signal generator; Calibration; Hardware; Radio frequency; Scattering parameters; Signal analysis; Signal generators; Software measurement; Switches; Testing; Vectors;
Conference_Titel :
Microwave Measurement Symposium, 2008 72nd ARFTG
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4244-2300-2
Electronic_ISBN :
978-1-4244-2300-2
DOI :
10.1109/ARFTG.2008.4804287
