DocumentCode :
3034590
Title :
CARMEN2/MEX: An in-flight laboratory for the observation of radiation effects on electronic devices
Author :
Bezerra, Françoise ; Ecoffet, Robert ; Lorfèvre, Eric ; Samaras, Anne ; Deneau, Christelle
Author_Institution :
Centre Nat. d´´Etudes Spatiales, Toulouse, France
fYear :
2011
fDate :
19-23 Sept. 2011
Firstpage :
607
Lastpage :
614
Abstract :
The CARMEN2/MEX instrument has been measuring radiation effects on electronic devices on board the JASON2 satellite since June 22 2008. This paper presents updated data concerning destructive phenomena and complementary observations for cumulative phenomena and Single Event Transients.
Keywords :
radiation hardening (electronics); space vehicle electronics; CARMEN2-MEX instrument; JASON2 satellite; electronic devices; in-flight laboratory; radiation effects; single event transients; Instruments; Ionization; Performance evaluation; Protons; Random access memory; Satellites; CARMEN2; DDE; JASON2; MEX; SEB; SEL; SET; TID; protons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
ISSN :
0379-6566
Print_ISBN :
978-1-4577-0585-4
Type :
conf
DOI :
10.1109/RADECS.2011.6131430
Filename :
6131430
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3034590
بازگشت