Title : 
Pre-bonding method using self-alignment effect for multichip packaging
         
        
            Author : 
Lee, Jae Hak ; Ha, Tae Ho ; Lee, Chang Woo ; Song, Jun-Yeob ; Cha, Min Seok ; Yoo, Choong Don
         
        
            Author_Institution : 
Dep. of Ultra Precision Machines & Syst., KIMM, Daejeon, South Korea
         
        
        
        
        
        
            Abstract : 
An efficient C2C/C2W oxide bonding technique using self-alignment effect of a pair of hydrophilic chip surfaces, which are activated by plasma, is applied to 3D stacking of multichip packaging in this work. Self-alignment and pre-bonding technique can provide high-speed bonding process and high-precision chip alignment accuracy simultaneously without high-precision chip manipulator. Through experiments, we could acquire high hydrophilic silicon surfaces using plasma surface activation and measured position errors and rotational error of aligned chips is smaller than 5 ¿m and 0.04 degrees respectively because of self-alignment effect between hydrophilic surfaces of chips. In addition, temporary bonding is formed successfully by secondary bonding between silanol groups (Si-OH) on the hydrophilic silicon chip surfaces when the DI water is evaporated by heating, which prevents contamination of bonding surface and helps of manipulation of multi-stacked chips easily.
         
        
            Keywords : 
elemental semiconductors; high-speed techniques; hydrophilicity; integrated circuit bonding; multichip modules; silicon; 3D stacking; Si; chip-to-chip/chip-to-wafer oxide bonding technique; high-precision chip alignment accuracy; high-speed bonding process; hydrophilic chip surfaces; hydrophilic silicon chip surfaces; multi-stacked chips; multichip packaging; plasma surface activation; position errors; pre-bonding method; rotational error; self-alignment effect; silanol group; Bonding processes; Packaging; Plasma applications; Plasma measurements; Pollution measurement; Position measurement; Rotation measurement; Silicon; Stacking; Surface contamination; 3D stacking; Self-alignment; hydrophilic surface; multichip packaging; oxide bonding;
         
        
        
        
            Conference_Titel : 
Assembly and Manufacturing, 2009. ISAM 2009. IEEE International Symposium on
         
        
            Conference_Location : 
Suwon
         
        
            Print_ISBN : 
978-1-4244-4627-8
         
        
            Electronic_ISBN : 
978-1-4244-4628-5
         
        
        
            DOI : 
10.1109/ISAM.2009.5376918