• DocumentCode
    303467
  • Title

    Accelerated aging of high voltage stator bars using a power electronic converter

  • Author

    Sheehy, R.C. ; Blackburn, T.R. ; Rungis, Juris

  • Author_Institution
    Dept. of Electr. Power, New South Wales Univ., Kensington, NSW, Australia
  • Volume
    1
  • fYear
    1996
  • fDate
    16-19 Jun 1996
  • Firstpage
    230
  • Abstract
    The use of computer-aided partial discharge detectors has become an increasingly useful tool in the application of electric machine insulation condition monitoring. The problem that exists is the lack of field and laboratory data associated with the faults that the condition monitoring aims to find. A stator winding aging bed has been constructed to allow the monitoring of the growth of induced faults, for comparison with field measurements. The use of a low emission, variable frequency power electronic converter, along with a computer-based discharge analyser, has allowed the study of supply frequency dependence of partial discharge activity along with the monitoring of fault initiation and development. The layout of the aging bed is discussed along with the operating performance of the variable frequency converter and partial discharge results gathered
  • Keywords
    ageing; automatic test equipment; electric breakdown; insulation testing; life testing; machine insulation; machine testing; partial discharges; power convertors; stators; accelerated aging; computer-aided partial discharge detectors; electric machine insulation condition monitoring; fault development; fault initiation; high voltage stator bars; insulation breakdown tests; operating performance; partial discharge activity; power electronic converter; stator winding aging bed; test automation; Accelerated aging; Application software; Computerized monitoring; Condition monitoring; Detectors; Electric machines; Frequency conversion; Partial discharges; Stator bars; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on
  • Conference_Location
    Montreal, Que.
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-3531-7
  • Type

    conf

  • DOI
    10.1109/ELINSL.1996.549324
  • Filename
    549324