Title :
Future trends in flash memories
Author_Institution :
Hyundai Electronics America
Keywords :
Cellular networks; Consumer electronics; EPROM; Flash memory; Low voltage; Manufacturing processes; Random access memory; Semiconductor memory; Telephony; Tunneling;
Conference_Titel :
Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
Print_ISBN :
0-8186-7466-0
DOI :
10.1109/MTDT.1996.782468
