DocumentCode
3034689
Title
Future trends in flash memories
Author
Grossman, Steve
Author_Institution
Hyundai Electronics America
fYear
1996
fDate
1996
Firstpage
2
Lastpage
3
Keywords
Cellular networks; Consumer electronics; EPROM; Flash memory; Low voltage; Manufacturing processes; Random access memory; Semiconductor memory; Telephony; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
ISSN
1087-4852
Print_ISBN
0-8186-7466-0
Type
conf
DOI
10.1109/MTDT.1996.782468
Filename
782468
Link To Document