DocumentCode :
3034838
Title :
PROBA-II Technology Demonstration Module in-flight data analysis
Author :
Harboe-Sørensen, R. ; Poivey, C. ; Zadeh, A. ; Keating, A. ; Fleurinck, N. ; Puimege, K. ; Guerre, F.-X. ; Lochon, F. ; Kaddour, M. ; Li, L. ; Walter, D.
Author_Institution :
RHS, Voorhout, Netherlands
fYear :
2011
fDate :
19-23 Sept. 2011
Firstpage :
581
Lastpage :
586
Abstract :
A Technology Demonstration Module (TDM) to monitor radiation effects in semiconductor devices was part of the payload on-board the European Space Agency (ESA) PROBA-II satellite. PROBA-II was launched on November 2nd 2009, into an 800 km polar orbit with the TDM switched-on since February 15th 2010. The TDM primarily carries modern memory devices in order to monitor and record their Single Event Effect (SEE) behavior in respect to orbital positions. This paper presents details of in-flight data obtained between February 15th 2010 and March 31st 2011. Observed in-flight error rates are compared with predictions based on ground test data obtained on flight lot devices operating under identical conditions.
Keywords :
modules; radiation effects; semiconductor devices; space vehicle electronics; storage management chips; European Space Agency; PROBA-II satellite; PROBA-II technology demonstration module; SEE behavior; flight lot devices; ground test data; in-flight data analysis; memory devices; payload on-board; radiation effect monitoring; semiconductor devices; single event effect; Monitoring; Protons; Random access memory; Temperature distribution; Temperature measurement; Temperature sensors; Time division multiplexing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
ISSN :
0379-6566
Print_ISBN :
978-1-4577-0585-4
Type :
conf
DOI :
10.1109/RADECS.2011.6131440
Filename :
6131440
Link To Document :
بازگشت