Title :
Gating effects in time domain transforms
Author_Institution :
Agilent Technol., Santa Rosa, CA
Abstract :
Gating is well known in modern VNAs for improving or isolating responses from multiple reflections in the frequency and time domain. However, the particular details of how positions of selections of the gate start and stop values, as well as gate shapes, aliasing and masking effects are not well documented. This paper presents an explanation of gate band-edge effects due to renormalization effects, and masking effects, and provides recommendations for improving the effectiveness of gating.
Keywords :
Fourier transforms; network analysers; time-varying networks; vectors; VNA; gate band edge effects; gating effects; masking effects; multiple reflections; renormalization effects; time domain transforms; vector network analysers; Convolution; Filtering theory; Fourier transforms; Frequency domain analysis; Frequency measurement; Frequency response; Isolation technology; Shape; Time factors; Time measurement;
Conference_Titel :
Microwave Measurement Symposium, 2008 72nd ARFTG
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4244-2300-2
Electronic_ISBN :
978-1-4244-2300-2
DOI :
10.1109/ARFTG.2008.4804303
