DocumentCode
3035027
Title
Recent developments in dram testing
Author
Cockburn, Bruce E.
Author_Institution
University of Alberta
fYear
1996
fDate
1996
Firstpage
6
Lastpage
7
Keywords
Automatic testing; Costs; Design engineering; Electronic equipment testing; Failure analysis; Fault location; Production; Random access memory; Semiconductor device testing; Semiconductor memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
ISSN
1087-4852
Print_ISBN
0-8186-7466-0
Type
conf
DOI
10.1109/MTDT.1996.782483
Filename
782483
Link To Document