Title :
Built in self testing for detection of coupling faults in semiconductor memories
Author :
Karpovsky, Mark G. ; Das, Debaleena ; Vardhan, Harsh
Author_Institution :
Boston University
Keywords :
Automatic testing; Built-in self-test; Decoding; Electrical fault detection; Fault detection; Logic arrays; Random access memory; Read-write memory; Semiconductor memory; System testing;
Conference_Titel :
Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
Print_ISBN :
0-8186-7466-0
DOI :
10.1109/MTDT.1996.782484
