Title :
A built in self test scheme for 256Meg sdram
Author :
Hii, Francis ; Powell, Theo ; Cline, Dan
Author_Institution :
Texas Instruments
Keywords :
Automatic testing; Built-in self-test; Circuit testing; Electronic equipment testing; Instruments; Pins; Read only memory; SDRAM; Signal generators; Timing;
Conference_Titel :
Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
Print_ISBN :
0-8186-7466-0
DOI :
10.1109/MTDT.1996.782485
