Title :
Flash memory technology - A review
Author_Institution :
Hyundai Electronics America
Abstract :
The author very briefly outlines the history of flash memory development, the physics behind the operation of flash memory, various technological approaches, testing issues, and the fbture anticipated developments for flash memories.
Keywords :
Automatic testing; Consumer electronics; EPROM; Flash memory; Logic testing; Personal digital assistants; Power supplies; Sequential analysis; Tunneling; Voltage;
Conference_Titel :
Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
Conference_Location :
Singapore
Print_ISBN :
0-8186-7466-0
DOI :
10.1109/MTDT.1996.782491
