Title :
Rambist builder: a methodology for automatic built-in self-test design of embedded rams
Author :
Rajsuman, Rochit
Author_Institution :
LSI Logic
Keywords :
Application specific integrated circuits; Automatic testing; Built-in self-test; Circuit faults; Circuit synthesis; Circuit testing; Design automation; Logic testing; Random access memory; Read-write memory;
Conference_Titel :
Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
Print_ISBN :
0-8186-7466-0
DOI :
10.1109/MTDT.1996.782492
