• DocumentCode
    3035315
  • Title

    A new irradiation facility for neutron-induced Single Event Effect studies at LNL

  • Author

    Bisello, Dario ; Candelori, Andrea ; Dzysiuk, Natalia ; Esposito, Juan ; Mastinu, Pierfrancesco ; Mattiazzo, Serena ; Prete, Gianfranco ; Silvestrin, Luca ; Wyss, Jeffery

  • Author_Institution
    Dept. of Phys., Univ. of Padova, Padova, Italy
  • fYear
    2011
  • fDate
    19-23 Sept. 2011
  • Firstpage
    760
  • Lastpage
    766
  • Abstract
    This paper describes the project of a new neutron irradiation facility for studying neutron-induced Single Event Effects in electronic devices and systems. The facility will be installed at the next future high-current (500 μA) variable-energy (35-70 MeV) cyclotron of the INFN National Laboratory of Legnaro (LNL), Padova, Italy, and it will offer an atmospheric-like and monochromatic neutron beams, beyond of the straightforward proton beam. These beams will integrate the proton and heavy ions facilities presently operating at the LNL for radiation damage studies on semiconductor detectors and electronic devices.
  • Keywords
    cyclotrons; neutron beams; neutron effects; proton effects; radiation hardening (electronics); semiconductor counters; INFN National Laboratory of Legnaro; Italy; Padova; atmospheric-like neutron beam; current 500 muA; electron volt energy 35 MeV to 70 MeV; electronic devices; electronic systems; heavy-ion facility; high-current variable-energy cyclotron; monochromatic neutron beam; neutron irradiation facility; neutron-induced single-event effect studies; proton beam; proton facility; radiation damage; semiconductor detectors; Atmospheric modeling; Materials; Neutrons; Particle beams; Production; Protons; Radiation effects; Single Event Effects; irradiation facility; neutron radiation effects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
  • Conference_Location
    Sevilla
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0585-4
  • Type

    conf

  • DOI
    10.1109/RADECS.2011.6131462
  • Filename
    6131462