DocumentCode :
3035324
Title :
Thermal monitoring of memories
Author :
Szekely, V. ; Courtois, B.
Author_Institution :
Technical University of Budapest
fYear :
1996
fDate :
1996
Firstpage :
86
Lastpage :
91
Keywords :
Monitoring; Packaging; Random access memory; Semiconductor device measurement; Semiconductor materials; Sensor systems; System testing; Temperature sensors; Thermal sensors; Thermoresistivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
ISSN :
1087-4852
Print_ISBN :
0-8186-7466-0
Type :
conf
DOI :
10.1109/MTDT.1996.782497
Filename :
782497
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3035324
بازگشت