DocumentCode
3035324
Title
Thermal monitoring of memories
Author
Szekely, V. ; Courtois, B.
Author_Institution
Technical University of Budapest
fYear
1996
fDate
1996
Firstpage
86
Lastpage
91
Keywords
Monitoring; Packaging; Random access memory; Semiconductor device measurement; Semiconductor materials; Sensor systems; System testing; Temperature sensors; Thermal sensors; Thermoresistivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
ISSN
1087-4852
Print_ISBN
0-8186-7466-0
Type
conf
DOI
10.1109/MTDT.1996.782497
Filename
782497
Link To Document