DocumentCode
3035367
Title
RAM diagnostic tests
Author
Yarmolik, V.N. ; Klimets, Yu.V. ; van de Goor, A.J. ; Demidenko, S.N.
Author_Institution
Belarusian State University
fYear
1996
fDate
1996
Firstpage
100
Lastpage
102
Keywords
Electronic equipment testing; Fault detection; Fault diagnosis; Fault location; Informatics; Information technology; Random access memory; Read-write memory; Software testing; State estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
ISSN
1087-4852
Print_ISBN
0-8186-7466-0
Type
conf
DOI
10.1109/MTDT.1996.782499
Filename
782499
Link To Document