Title :
RAM diagnostic tests
Author :
Yarmolik, V.N. ; Klimets, Yu.V. ; van de Goor, A.J. ; Demidenko, S.N.
Author_Institution :
Belarusian State University
Keywords :
Electronic equipment testing; Fault detection; Fault diagnosis; Fault location; Informatics; Information technology; Random access memory; Read-write memory; Software testing; State estimation;
Conference_Titel :
Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
Print_ISBN :
0-8186-7466-0
DOI :
10.1109/MTDT.1996.782499
