DocumentCode :
3035381
Title :
A true testprocessor-per-pin algorithmic pattern generator
Author :
Hilliges, Klaus-Dieter ; Sundermann, Jens
Author_Institution :
Hewlett Packard GmbH
fYear :
1996
fDate :
1996
Firstpage :
103
Lastpage :
109
Keywords :
Bandwidth; Cost function; Integrated circuit testing; Logic testing; Production; Random access memory; System buses; System testing; Test pattern generators; Time to market;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
ISSN :
1087-4852
Print_ISBN :
0-8186-7466-0
Type :
conf
DOI :
10.1109/MTDT.1996.782500
Filename :
782500
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3035381
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