• DocumentCode
    3035557
  • Title

    Assessment of graphene nanomesh and nanoroad transistors by chemical modification

  • Author

    Seol, Gyungseon ; Guo, Jing

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Florida, Gainesville, FL, USA
  • fYear
    2011
  • fDate
    5-7 Dec. 2011
  • Abstract
    Chemical modification of graphene plays an important role on opening a bandgap for potential digital electronic device applications. We propose and examine the performance limits of graphene nanoroad and graphene nanomesh transistors created by selective hydrogenation and fluorination of graphene. First principle ab intio simulations with a ballistic transistor model are applied to model two-dimensional transistor channels made of hydrogenated or fluorinated graphene nanoroads and nanomeshes. It is shown that array of graphene nanoroads defined by hydrogenation or fluorination of atomically narrow dimmer lines in a 2D graphene are most ideal for transistor channel material in terms of delivering a large on-current, which significantly outperforms Si MOSFETs. In addition, comparable performance to silicon can be achieved by careful designed graphene nanomesh through patterned hydrogenation or fluorination. Fluorination is shown to be energetically more preferred and easier to achieve than hydrogenation.
  • Keywords
    MOSFET; graphene; hydrogenation; nanoelectronics; nanorods; semiconductor device models; silicon; 2D transistor channels; C; MOSFET; Si; ballistic transistor model; chemical modification; digital electronic device; fluorination; graphene nanomesh transistors; graphene nanoroad transistors; selective hydrogenation; transistor channel material; FETs; Photonic band gap; Quantum capacitance; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2011 IEEE International
  • Conference_Location
    Washington, DC
  • ISSN
    0163-1918
  • Print_ISBN
    978-1-4577-0506-9
  • Electronic_ISBN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.2011.6131474
  • Filename
    6131474