Title :
Built-In Hardware for Analog Circuitry Testing
Author :
Assaf, Mansour H. ; Fathi, Maryam
Author_Institution :
Univ. of Trinidad & Tobago, Arima
fDate :
Sept. 30 2008-Oct. 3 2008
Abstract :
Testing analog circuits is a challenging endeavor. The subject paper investigates the oscillation-based built-in self-test (OBIST) technique for testing the analog circuits. An analog circuit-testing environment based on the OBIST method is considered and implemented.Experimental results show that OBIST is a promising testing method for analog circuits which neither requires a stimulus generator nor a complex result analyzer.
Keywords :
analogue circuits; built-in self test; circuit testing; oscillations; analog circuitry testing; built-in hardware; oscillation-based built-in self-test technique; Analog circuits; Automotive engineering; Circuit faults; Circuit testing; Design for testability; Digital circuits; Electronic equipment testing; Hardware; Integrated circuit testing; Semiconductor device testing; Automatic test equipment (ATE); Built-in self-test (BIST); OBIST; circuit under test (CUT); test pattern generator (TPG);
Conference_Titel :
Electronics, Robotics and Automotive Mechanics Conference, 2008. CERMA '08
Conference_Location :
Morelos
Print_ISBN :
978-0-7695-3320-9
DOI :
10.1109/CERMA.2008.7
