Title :
Electronic devices based on niobate barium-strontium thin film
Author :
Baginsky, I.L. ; Kostsov, E.G. ; Sterelykhina, L.N.
Author_Institution :
Inst. of Autom. & Electrometry, Acad. of Sci., Novosibirsk, USSR
Abstract :
The devices considered were based on barium-strontium niobate (BSN) films composed of Ba0.5Sr0.5Nb2O 6, which were obtained by plasmo-chemical reactions of oxide molecule formation being realized near the substrate surface. Ferroelectric thin-film technology was used with film deposition based on RF-sputtering. The electrically erasable programmable read-only memory (PROM) element was constructed on the basis of metal-ferroelectric-insulator-semiconductor (silicon) structure. Introduction of thin ferroelectric film in MIS structures with electrical memory allows parameter improvement. A read-only electrically erasable element constructed on the base of a metal-ferroelectric-metal structure is described. A memory element with a M-BSN-M structure of 2-4-μm thickness doped with isomorphic elements is proposed. An accumulation capacitor of dynamic memory element was created also on the basis of this structure. (5) An infrared pyroelectric receiver was made on the basis of the M-BSN-M structure
Keywords :
EPROM; barium compounds; capacitors; elemental semiconductors; ferroelectric devices; ferroelectric storage; ferroelectric thin films; infrared detectors; metal-insulator-semiconductor devices; permittivity; plasma deposited coatings; pyroelectric devices; silicon; sputtered coatings; strontium compounds; 2 to 4 micron; BSN; EEPROM element; M-BSN-M structure; MIS structures; RF-sputtering; accumulation capacitor; dynamic memory element; electrically erasable programmable read-only memory; electronic devices; ferroelectric thin-film technology; film deposition; films; infrared pyroelectric receiver; isomorphic elements; metal-ferroelectric-insulator-semiconductor structure; oxide molecule formation; parameter improvement; permittivity; plasmo-chemical reactions; read-only electrically erasable element; semiconductor; substrate surface; Capacitors; Ferroelectric films; Ferroelectric materials; Niobium compounds; PROM; Silicon; Sputtering; Strontium; Substrates; Thin film devices;
Conference_Titel :
Applications of Ferroelectrics, 1990., IEEE 7th International Symposium on
Conference_Location :
Urbana-Champaign, IL
Print_ISBN :
0-7803-0190-0
DOI :
10.1109/ISAF.1990.200246