Title :
Efficient, parallel, and invariant shape recognition algorithms for complex industrial tasks
Author :
Lee, Hanjin ; Sinha, Divyendu
Author_Institution :
Daewoo Electron. Co. Ltd., Seoul, South Korea
Abstract :
The task of recognizing complex objects in an industrial environment is considered. Two massively parallel algorithms for shape recognition that are based on the notion of horizontal and vertical distances between two points on the XY plane are introduced. It has been shown theoretically that these algorithms provide close to perfect invariant geometric characterization of every possible image. The algorithms are applied to the task of distinguishing between commonly cited industrial parts to demonstrate their efficacy in real-life scenarios. Issues related to rotation by arbitrary angles and magnification in the discrete domain are addressed in detail. The proposed schemes provide theoretically predictable, invariant, and efficient shape recognition and discrimination
Keywords :
automatic optical inspection; computerised pattern recognition; parallel algorithms; computerised pattern recognition; industrial parts recognition; inspection; invariant geometric characterization; invariant shape recognition algorithms; magnification; parallel algorithms; rotation; shape discrimination; Computer science; Electronics industry; Feature extraction; Image analysis; Image processing; Industrial electronics; Machine vision; Pattern recognition; Reflection; Shape;
Conference_Titel :
Systems, Man and Cybernetics, 1990. Conference Proceedings., IEEE International Conference on
Conference_Location :
Los Angeles, CA
Print_ISBN :
0-87942-597-0
DOI :
10.1109/ICSMC.1990.142127