Title :
A 600MHz MTJ-based nonvolatile latch making use of incubation time in MTJ switching
Author :
Endoh, T. ; Togashi, S. ; Iga, F. ; Yoshida, Y. ; Ohsawa, T. ; Koike, H. ; Fukami, S. ; Ikeda, S. ; Kasai, N. ; Sakimura, N. ; Hanyu, T. ; Ohno, H.
Author_Institution :
Center for Spintronics Integrated Syst., Tohoku Univ., Sendai, Japan
Abstract :
The incubation (transit) time of the perpendicular magnetic tunnel junction (MTJ) is found shorter (longer) than the in-plane MTJ. By making use of the incubation time, a new concept is proposed for MTJ/CMOS hybrid circuits that operate as fast as CMOS circuits without operation power overhead and with negligible MTJ switching error. A nonvolatile latch based on the concept is fabricated in 90nm technology to demonstrate 600MHz stable operation.
Keywords :
CMOS logic circuits; UHF integrated circuits; flip-flops; magnetic logic; magnetic microwave devices; magnetic tunnelling; MTJ switching error; MTJ-CMOS hybrid circuits; frequency 600 MHz; incubation transit time; nonvolatile latch; operation power overhead; perpendicular magnetic tunnel junction; size 90 nm; CMOS integrated circuits; CMOS technology; Hybrid power systems; Latches; Magnetic tunneling; Switches; Switching circuits;
Conference_Titel :
Electron Devices Meeting (IEDM), 2011 IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4577-0506-9
Electronic_ISBN :
0163-1918
DOI :
10.1109/IEDM.2011.6131487
