DocumentCode :
3035907
Title :
Device circuit co-design using classical and non-classical III–V Multi-Gate Quantum-Well FETs (MuQFETs)
Author :
Liu, Lu ; Saripalli, Vinay ; Narayanan, Vijay ; Datta, Suman
Author_Institution :
Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA
fYear :
2011
fDate :
5-7 Dec. 2011
Abstract :
This paper presents ultra low-power reconfigurable logic and single-electron memory architecture to enable sub-300 mV VCC operation using classical and non-classical (NC) III-V Multi-Gate Quantum Well Field Effect Transistors (MuQFETs). A strained In0.7Ga0.3As quantum-well based classical multi-gate FET and an In0.7Ga0.3As MuQFET operating in Coulomb-blockade mode with tunable tunnel barrier are experimentally demonstrated. Reconfigurable Binary Decision Diagram (BDD) logic and single-electron SRAM implementations based on III-V MuQFETs are demonstrated. Using device models well calibrated to experiments, we show 50% reduction in minimum-energy for logic, and 75× reduction in dynamic power for memory at equivalent performance over Si CMOS logic.
Keywords :
CMOS logic circuits; CMOS memory circuits; Coulomb blockade; III-V semiconductors; MOSFET; SRAM chips; binary decision diagrams; calibration; elemental semiconductors; gallium arsenide; indium compounds; integrated circuit design; integrated circuit modelling; low-power electronics; quantum well devices; semiconductor device models; silicon; single electron devices; CMOS logic circuit; In0.7Ga0.3As; Si; classical III-V MuQFET; classical III-V multigate quantum-well FET; coulomb-blockade mode; device circuit codesign; low-power reconfigurable BDD logic; low-power reconfigurable binary decision diagram logic; nonclassical III-V MuQFET; nonclassical III-V multigate quantum-well FET; single-electron SRAM implementation; strained quantum-well; tunable tunnel barrier; Boolean functions; Data structures; FinFETs; Logic gates; Random access memory; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2011 IEEE International
Conference_Location :
Washington, DC
ISSN :
0163-1918
Print_ISBN :
978-1-4577-0506-9
Electronic_ISBN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.2011.6131489
Filename :
6131489
Link To Document :
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