• DocumentCode
    3036078
  • Title

    Self-heating induced feedback effect on drain current mismatch and its modeling

  • Author

    Kuo, Jack J -Y ; Su, Pin

  • Author_Institution
    Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2011
  • fDate
    5-7 Dec. 2011
  • Abstract
    We have reported and modeled a self-heating induced feedback effect on the drain current mismatch of nanoscale MOSFETs. The accuracy of the new model has been verified with experimental data. This effect needs to be considered when one-to-one comparisons between SOI and bulk devices regarding the variability are made.
  • Keywords
    MOSFET; feedback; nanotechnology; SOI; bulk devices; drain current mismatch; nanoscale MOSFET; self-heating induced feedback effect; Data models; FinFETs; Integrated circuit modeling; Logic gates; Temperature; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2011 IEEE International
  • Conference_Location
    Washington, DC
  • ISSN
    0163-1918
  • Print_ISBN
    978-1-4577-0506-9
  • Electronic_ISBN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.2011.6131496
  • Filename
    6131496
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3036078