Title :
Self-heating induced feedback effect on drain current mismatch and its modeling
Author :
Kuo, Jack J -Y ; Su, Pin
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
We have reported and modeled a self-heating induced feedback effect on the drain current mismatch of nanoscale MOSFETs. The accuracy of the new model has been verified with experimental data. This effect needs to be considered when one-to-one comparisons between SOI and bulk devices regarding the variability are made.
Keywords :
MOSFET; feedback; nanotechnology; SOI; bulk devices; drain current mismatch; nanoscale MOSFET; self-heating induced feedback effect; Data models; FinFETs; Integrated circuit modeling; Logic gates; Temperature; Temperature dependence;
Conference_Titel :
Electron Devices Meeting (IEDM), 2011 IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4577-0506-9
Electronic_ISBN :
0163-1918
DOI :
10.1109/IEDM.2011.6131496
