• DocumentCode
    3036610
  • Title

    Growth and dielectric characterization of `relaxor ferroelectric´ Pb(Mg1/3Nb2/3)O3 single crystals

  • Author

    Ye, Z.G. ; Rivera, J.P. ; Schmid, H.

  • Author_Institution
    Dept. de Chimie Miner., Anal. et Appliques, Geneve Univ., Switzerland
  • fYear
    1990
  • fDate
    6-8 Jun 1990
  • Firstpage
    482
  • Lastpage
    485
  • Abstract
    Single crystals of the perovskite Pb(Mg1/3Nb2/3 )O3 [PMN] were grown by the high-temperature solution technique, according to an originally established pseudobinary phase diagram between PMN and PbO. The temperature dependence and frequency dependence of the complex dielectric permittivity were measured on thin platelets of different crystallographic sections by means of quasi-continuous frequency scanning from 1 kHz to 10 MHz, at temperatures ranging from 12.5 K to 418 K. The dielectric properties of the PMN platelets are characterized by an intermediate state between relaxation and resonance
  • Keywords
    crystal growth from solution; ferroelectric materials; lead compounds; permittivity; 1 kHz to 10 MHz; 12.5 to 418 K; PMN; PbMgO3NbO3; complex dielectric permittivity; frequency dependence; intermediate state; relaxor ferroelectric; single crystals; solution growth; temperature dependence; Crystallography; Crystals; Dielectric measurements; Frequency dependence; Frequency measurement; Niobium; Permittivity measurement; Relaxor ferroelectrics; Temperature dependence; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 1990., IEEE 7th International Symposium on
  • Conference_Location
    Urbana-Champaign, IL
  • Print_ISBN
    0-7803-0190-0
  • Type

    conf

  • DOI
    10.1109/ISAF.1990.200294
  • Filename
    200294
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3036610