DocumentCode :
3037123
Title :
Development of a 3-DOF silicon piezoresistive micro accelerometer
Author :
Dao, Dzung Viet ; Okada, Shigeya ; Dau, V.T. ; Toriyama, Toshiyuki ; Sugiyama, Susumu
Author_Institution :
Center for Promotion of the COE Program, Ritsumeikan Univ., Shiga, Japan
fYear :
2004
fDate :
31 Oct.-3 Nov. 2004
Firstpage :
271
Lastpage :
276
Abstract :
This paper presents the design, fabrication and calibration results of a three degrees of freedom (3-DOF) micro accelerometer utilizing piezoresistive effect in Si. The sensor can detect three components of linear acceleration simultaneously. The sensing structure is a picture-frame type, i.e. the four sensing beams are surrounding the seismic mass. Therefore, the proposed sensor is smaller than the cross-beam type accelerometer having the same sensitivity. Frequency performance and noise problems are analyzed. The accelerometer has been fabricated by MEMS (micro electromechanical systems) technology, and packaged to a ceramic case. Preliminary calibration results show linear output voltage and small cross-sensitivity.
Keywords :
accelerometers; calibration; elemental semiconductors; micromechanical devices; piezoresistive devices; semiconductor device noise; silicon; MEMS; Si; calibration; frequency performance; linear acceleration; micro electromechanical systems; noise problems; piezoresistive micro accelerometer; seismic mass; sensing beams; sensing structure; silicon; three degrees of freedom micro accelerometer; Acceleration; Accelerometers; Calibration; Electromechanical sensors; Fabrication; Frequency; Micromechanical devices; Performance analysis; Piezoresistance; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro-Nanomechatronics and Human Science, 2004 and The Fourth Symposium Micro-Nanomechatronics for Information-Based Society, 2004. Proceedings of the 2004 International Symposium on
Print_ISBN :
0-7803-8607-8
Type :
conf
DOI :
10.1109/MHS.2004.1421317
Filename :
1421317
Link To Document :
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