Title :
Formation of organic ferroelectric thin films by vacuum evaporation under electric field
Author :
Horiuchi, Toshihisa ; Yoshida, Yuuji ; Matsushige, Kazumi
Author_Institution :
Dept. of Appl. Sci., Kyushu Univ., Fukuoka, Japan
Abstract :
Crystal structures and molecular orientation in the ferroelectric polymer of polyvinylidene fluoride, PVDF, evaporated with and without an electric field were investigated. In order to evaluate the molecular structures in the thin films formed on a SiO2 glass substrate, a newly developed energy dispersive total reflection X-ray diffractometer was successfully utilized. Anomalous lamellae structures in evaporated PVDF thin films and the changes induced by the heat treatment were observed. It was revealed that the molecules which have a dipole moment perpendicular to the molecular axis can be controlled by the application of the electric field during the evaporation process
Keywords :
X-ray diffraction examination of materials; ferroelectric thin films; heat treatment; molecular orientation; polymer films; vacuum deposition; PVDF; SiO2 glass substrate; crystal structures; electric field; energy dispersive total reflection X-ray diffractometer; heat treatment; lamellae structures; molecular orientation; organic ferroelectric thin films; polymer; polyvinylidene fluoride; vacuum evaporation; Dispersion; Ferroelectric materials; Optical reflection; Polymer films; Sputtering; Substrates; Temperature; Transistors; X-ray diffraction; X-ray scattering;
Conference_Titel :
Applications of Ferroelectrics, 1990., IEEE 7th International Symposium on
Conference_Location :
Urbana-Champaign, IL
Print_ISBN :
0-7803-0190-0
DOI :
10.1109/ISAF.1990.200342
