DocumentCode
3037644
Title
[Title page i]
fYear
2008
fDate
1-3 Oct. 2008
Abstract
The following topics were dealt with: defect and fault tolerance; dependability analysis and evaluation; reliability; error detection and correction; testing.
Keywords
VLSI; fault tolerance; integrated circuit reliability; testing; VLSI; defect; dependability analysis; error correction; error detection; fault tolerance; reliability; testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on
Conference_Location
Boston, MA
ISSN
1550-5774
Print_ISBN
978-0-7695-3365-0
Type
conf
DOI
10.1109/DFT.2008.1
Filename
4641144
Link To Document