DocumentCode
3037646
Title
Wire drawing process simulation of Polycrystalline diamond wire drawing die
Author
Rui-xue, Wang ; Chuan-kun, Li ; Xue-jun, Lu ; Jing-rui, Yang
Author_Institution
Beijing Inst. of Electro-Machining, Beijing DMBEST Tool Technol. Co., Ltd., Beijing, China
Volume
3
fYear
2012
fDate
25-27 May 2012
Firstpage
212
Lastpage
216
Abstract
The wire drawing process of Polycrystalline diamond (PCD) wire drawing die is simulated by ABAQUS FEA software, which is used in drawing solar wafer cutting wire. According to the requirements of structure and sizes of shaper hole in the actual production, the wire drawing die whose reduction angle is 8 degrees is used in this simulation firstly. And the axial stress distribution and maximum axial tensile stress curve of cutting wire, and the equivalent stress distribution and equivalent stress curve of PCD drawing die can be obtained. From the stress curve of PCD drawing die, it can be seen that the equivalent stress maximum of die blank is 5826Mpa. Finally, several wire drawing die with different reduction angles are simulated to analyze the effects of different reduction angles on drawing force in theory. This simulation on PCD wire drawing die provides some theoretical basis for the design of reduction angle.
Keywords
CAD; design for manufacture; dies (machine tools); finite element analysis; force; internal stresses; machinery production industries; production engineering computing; wire drawing; ABAQUS FEA software; PCD wire drawing die; axial stress distribution; axial tensile stress curve; drawing force; finite element analysis; polycrystalline diamond wire; reduction angle design; shaper hole size; shaper hole structure; solar wafer cutting wire drawing; wire drawing process simulation; Diamond-like carbon; Finite element methods; Force; Tensile stress; Wire drawing; ABAQUS; FEA; Polycrystalline diamond wire drawing die; cutting wire; drawing force;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Science and Automation Engineering (CSAE), 2012 IEEE International Conference on
Conference_Location
Zhangjiajie
Print_ISBN
978-1-4673-0088-9
Type
conf
DOI
10.1109/CSAE.2012.6272941
Filename
6272941
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