• DocumentCode
    3037890
  • Title

    Network Fault Model for Dependability Assessment of Networked Embedded Systems

  • Author

    Fummi, F. ; Quaglia, D. ; Stefanni, F.

  • Author_Institution
    Dipt. di Inf., Univ. di Verona, Verona
  • fYear
    2008
  • fDate
    1-3 Oct. 2008
  • Firstpage
    54
  • Lastpage
    62
  • Abstract
    This paper presents a network-based fault model for dependability assessment of distributed applications built over networked embedded systems. This fault model represents global failures in terms of wrong behavior of packet-based asynchronous data transmissions. Packets are subject to different faults, i.e., drop, cut, bit errors, and duplication; these events can model either HW/SW failures of the networked embedded systems or problems in the channel among them. The paper describes 1) the proposed fault model in relation with existing ones, 2) its possible application scenarios, and 3) a SystemC tool for the simulation of both fault-free and faulty wireless sensor networks. Experimental results show the validity of the approach in the verification of communication protocols and its support to determine the optimal number of nodes in a wireless sensor network based on the IEEE 802.15.4 standard. Part of the software is available at http://sourceforge.net/projects/scnsl/.
  • Keywords
    data communication; embedded systems; personal area networks; protocols; telecommunication network reliability; wireless sensor networks; IEEE 802.15.4 standard; SystemC tool; communication protocol; dependability assessment; faulty wireless sensor network; network fault model; networked embedded systems; packet-based asynchronous data transmission; Automata; Embedded system; Fault tolerant systems; ISO; Open systems; Petri nets; Transmitters; Very large scale integration; Wireless application protocol; Wireless sensor networks; SystemC; fault simulation; networked embedded systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on
  • Conference_Location
    Boston, MA
  • ISSN
    1550-5774
  • Print_ISBN
    978-0-7695-3365-0
  • Type

    conf

  • DOI
    10.1109/DFT.2008.21
  • Filename
    4641157