DocumentCode
3038227
Title
Error investigation of models for improved detection of masses in screening mammography
Author
Eltonsy, Nevine ; Essock-Burns, Emma ; Tourrasi, Georgia ; Elmaghraby, Adel
Author_Institution
Dept. of Comput. Eng. & Comput. Sci., Louisville Univ., KY
fYear
2005
fDate
21-21 Dec. 2005
Firstpage
794
Lastpage
799
Abstract
This study analyzes the performance of a computer aided detection (CAD) scheme for mass detection in mammography. We investigate the trained parameters of the detection scheme before any further testing. We use an extended version of a previously reported mass detection scheme. We analyze the detection parameters by using linear canonical discriminants (LCD) and compare results with logistic regression and multi layer perceptron neural network models. Preliminary results suggest that regression and multi layer perceptron neural network showed the best receiver operator characteristics (ROC). The LCD analysis predictive function showed that the trained CAD scheme performance can maintain 99.08% sensitivity (108/109) with false positive rate (FPI) of 8 per image with ROC Az= 0.74plusmn0.01. The regression and the multi layer perceptron neural network ROC analysis showed stronger backbone for the CAD algorithm viewing that the extended CAD scheme can operate at 96% sensitivity with 5.6 FPI per image. These preliminary results suggest that further logic to reduce FPI is needed for the CAD algorithm to be more predictive
Keywords
diagnostic radiography; error analysis; mammography; medical image processing; multilayer perceptrons; regression analysis; computer aided detection; linear canonical discriminants; logistic regression model; mammography; masses detection; multilayer perceptron neural network model; receiver operator characteristics; Algorithm design and analysis; Computer errors; Image analysis; Logic design; Logistics; Mammography; Neural networks; Performance analysis; Spine; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal Processing and Information Technology, 2005. Proceedings of the Fifth IEEE International Symposium on
Conference_Location
Athens
Print_ISBN
0-7803-9313-9
Type
conf
DOI
10.1109/ISSPIT.2005.1577200
Filename
1577200
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