DocumentCode
3038341
Title
A code-error calibrated two-step A/D converter
Author
Lee, S.-H. ; Song, B.-S.
Author_Institution
Analog Devices Semiconductor, Wilmington, MA, USA
fYear
1992
fDate
19-21 Feb. 1992
Firstpage
38
Lastpage
39
Abstract
A direct code-error calibration technique improving the linearity of two-step or multistep ADCs (analog-to-digital converters) is implemented in the digital domain. While conventional techniques calibrate code errors in the analog domain before conversion, the proposed technique calibrates digital outputs obtained by uncalibrated ADCs after conversion. This technique reduces feedthrough, offset, and interstage gain errors simultaneously. A block diagram of a digitally calibrated two-step flash ADC is shown. The experimental ADC uses a 2- mu m n-well CMOS technology.<>
Keywords
CMOS integrated circuits; analogue-digital conversion; calibration; coding errors; error correction; 2 micron; direct code-error calibration; flash ADC; interstage gain errors; multistep ADCs; n-well CMOS technology; two-step A/D converter; Image converters; Image processing; Solid state circuits; Videoconference;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1992. Digest of Technical Papers. 39th ISSCC, 1992 IEEE International
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-0573-6
Type
conf
DOI
10.1109/ISSCC.1992.200399
Filename
200399
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