• DocumentCode
    3038341
  • Title

    A code-error calibrated two-step A/D converter

  • Author

    Lee, S.-H. ; Song, B.-S.

  • Author_Institution
    Analog Devices Semiconductor, Wilmington, MA, USA
  • fYear
    1992
  • fDate
    19-21 Feb. 1992
  • Firstpage
    38
  • Lastpage
    39
  • Abstract
    A direct code-error calibration technique improving the linearity of two-step or multistep ADCs (analog-to-digital converters) is implemented in the digital domain. While conventional techniques calibrate code errors in the analog domain before conversion, the proposed technique calibrates digital outputs obtained by uncalibrated ADCs after conversion. This technique reduces feedthrough, offset, and interstage gain errors simultaneously. A block diagram of a digitally calibrated two-step flash ADC is shown. The experimental ADC uses a 2- mu m n-well CMOS technology.<>
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; calibration; coding errors; error correction; 2 micron; direct code-error calibration; flash ADC; interstage gain errors; multistep ADCs; n-well CMOS technology; two-step A/D converter; Image converters; Image processing; Solid state circuits; Videoconference;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1992. Digest of Technical Papers. 39th ISSCC, 1992 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-0573-6
  • Type

    conf

  • DOI
    10.1109/ISSCC.1992.200399
  • Filename
    200399