• DocumentCode
    3038364
  • Title

    A new failure analysis approach to predict and localize defects and weakness areas in trough-glass-vias for a multifunctional package level camera

  • Author

    El Amrani, A. ; Bouya, Mohsine ; Bouissa, Y. ; Benali, Abderraouf ; Faqir, M. ; Ghogho, Mounir ; Hadjoudja, A. ; Hlou, Laamari

  • Author_Institution
    Technopolis Rabat-Shore, Int. Univ. of Rabat-UIR, Sala el Jadida, Morocco
  • fYear
    2013
  • fDate
    15-19 July 2013
  • Firstpage
    437
  • Lastpage
    441
  • Abstract
    In this paper, we provide a novel approach to identify failures and defects that occur in the glass interposer of a system-on-package technology-based miniaturized multifunctional camera. First, we use simulations to validate the proposed defect prediction and/or weakness identification techniques. Then, we confirm the predictions using non-destructive failure analysis techniques. Finally, we use the physical analysis techniques to confirm the software failure mode assumptions.
  • Keywords
    cameras; failure analysis; glass; system-on-package; vias; defect localization; defect prediction; failure analysis approach; failure identification; glass interposer; miniaturized multifunctional camera; multifunctional package level camera; nondestructive failure analysis technique; physical analysis technique; software failure mode; system-on-package technology; trough-glass-vias; weakness identification technique; Decision support systems; Failure analysis; Integrated circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the
  • Conference_Location
    Suzhou
  • ISSN
    1946-1542
  • Print_ISBN
    978-1-4799-1241-4
  • Type

    conf

  • DOI
    10.1109/IPFA.2013.6599196
  • Filename
    6599196