DocumentCode :
3038377
Title :
A 17 b algorithmic ADC
Author :
Mallinson, A.M. ; Spitanly, P.
Author_Institution :
Analog Devices, Wilmington, MA, USA
fYear :
1992
fDate :
19-21 Feb. 1992
Firstpage :
40
Lastpage :
41
Abstract :
An analog-to-digital converter (ADC) is presented which uses auto gain-ranging to achieve signal amplification without the associated amplification of input-referred errors. The part, fabricated in a BiCMOS process, has a 108-dB dynamic range limited by white noise and DC errors <20 mu V. The system consists of an input multiplexer, two sample and holds (SHAs), an error amplifier, precision resistor/switch network, a window comparator and a CMOS gate array. Systematic offsets in the SHAs, noise in the loop, and gain accuracies (determined by resistor ratios) are the critical design parameters. The design challenge is to optimize the noise within the system bandwidth and remove all nonlinear forms of error. Performance in the time domain when a decaying exponential voltage with an 80-ms time constant is applied at the input is shown.<>
Keywords :
BiCMOS integrated circuits; amplification; analogue-digital conversion; errors; 17 bit resolution; BiCMOS process; CMOS gate array; DC errors; algorithmic ADC; auto gain-ranging; design parameters; error amplifier; input multiplexer; precision resistor/switch network; signal amplification; white noise; window comparator; Analog-digital conversion; Bandwidth; BiCMOS integrated circuits; Design optimization; Dynamic range; Multiplexing; Resistors; Signal to noise ratio; Switches; White noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1992. Digest of Technical Papers. 39th ISSCC, 1992 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-0573-6
Type :
conf
DOI :
10.1109/ISSCC.1992.200400
Filename :
200400
Link To Document :
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