• DocumentCode
    3038386
  • Title

    A Markovian Model for Default Risk in a Network of Sectors

  • Author

    Ching, Wai-Ki ; Leung, Ho-Yin ; Jiang, Hao ; Sun, Liang

  • Author_Institution
    Dept. of Math., Univ. of Hong Kong, Hong Kong, China
  • fYear
    2009
  • fDate
    24-26 July 2009
  • Firstpage
    373
  • Lastpage
    377
  • Abstract
    In this paper, we study the problem of modeling the dependence of defaults in different sectors. We consider multiple default data sequences as a network and model them by using a Markov chain model. The new network model allows us to compute two important risk measures, namely, value-at-risk (VaR) and expected shortfall (ES). Numerical experiments are given to illustrate the practical implementation of the model. We also perform empirical studies of the model using real default data sequences and analyze the empirical behaviors of the risk measures arising from the model.
  • Keywords
    Markov processes; operations research; risk management; Markov chain model; Markovian model; VaR; default risk; expected shortfall; multiple default data sequence; value-at-risk; Bonding; Business; Computer networks; Intelligent networks; Laboratories; Mathematical model; Mathematics; Reactive power; Sun; Yttrium; Default; Expected Shortfall; Network of Sectors; Risk Management; Value-at-Risk;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Business Intelligence and Financial Engineering, 2009. BIFE '09. International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-0-7695-3705-4
  • Type

    conf

  • DOI
    10.1109/BIFE.2009.92
  • Filename
    5208865