DocumentCode :
3038393
Title :
Design and fabrication of high accuracy GaAs Hall effect sensor grown by molecular beam epitaxy
Author :
Mohades-Kassai, A. ; Soufi, H.R.
Author_Institution :
Electron. Res. Center, Iran Univ. of Sci. & Technol., Tehran, Iran
fYear :
2000
fDate :
2000
Firstpage :
345
Lastpage :
348
Abstract :
A thin GaAs Hall effect sensor with good thermal stability has been grown by molecular beam epitaxy (MBE). This sensor transduces magnetic flux to a voltage signal. The Hall effect involves passing a current through a layer of semiconductor when a magnetic field is applied perpendicularly to the surface of the layer; a voltage is developed across the sides of the semiconductor which is directly proportional to the applied magnetic field. In order to meet the entire requirement of correct measurement and minimize errors, the GaAs layer was cut into a clover-leaf shape by means of a fine-nozzle sandblaster. The ohmic contacts were then formed by sintering indium into the GaAs layer in the presence of HCl gas
Keywords :
Hall effect transducers; III-V semiconductors; electric sensing devices; gallium arsenide; magnetic flux; magnetic sensors; molecular beam epitaxial growth; ohmic contacts; semiconductor growth; sintering; thermal stability; GaAs; GaAs Hall effect sensor; GaAs layer cutting; GaAs:In; HCl; HCl gas sintering atmosphere; Hall effect; In sintering; MBE; applied magnetic field; clover-leaf shape; current; design; error minimization; fine-nozzle sandblaster; magnetic flux; measurement accuracy; molecular beam epitaxy; ohmic contacts were; semiconductor layer; semiconductor voltage; thermal stability; thin GaAs Hall effect sensor; voltage signal; Fabrication; Gallium arsenide; Hall effect devices; Magnetic field measurement; Magnetic flux; Magnetic sensors; Molecular beam epitaxial growth; Shape measurement; Thermal stability; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics, 2000. ICM 2000. Proceedings of the 12th International Conference on
Conference_Location :
Tehran
Print_ISBN :
964-360-057-2
Type :
conf
DOI :
10.1109/ICM.2000.916474
Filename :
916474
Link To Document :
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