Title :
Design Space Exploration for the Design of Reliable SRAM-Based FPGA Systems
Author :
Bolchini, Cristiana ; Miele, Antonio
Author_Institution :
Dip. Elettron. e Inf., Politec. di Milano, Milano
Abstract :
This paper presents a design space exploration approach for the design of SRAM-based FPGAs with single event upsets fault mitigation capabilities, exploiting the feature of partial, dynamic reconfiguration offered by the target platform. In fact, in this scenario, several techniques are available and they can be applied at different granularity levels; thus, we propose a support for exploring the different alternatives by means of a framework taking into account several figures of merit, based on genetic algorithms. The several elements taken into account for evaluating the different solutions are here analyzed and discussed, and the application of the methodology and framework to some case studies is reported, allowing both a tuning of the metrics and the analysis of the identified most interesting solutions, which do not correspond, in general, to the trivial ones.
Keywords :
SRAM chips; field programmable gate arrays; genetic algorithms; FPGA systems; SRAM; design space exploration; genetic algorithms; single event upsets fault mitigation; Circuit testing; Fault detection; Fault diagnosis; Fault tolerant systems; Field programmable gate arrays; Genetic algorithms; Information analysis; Single event upset; Space exploration; Very large scale integration; Design Space Exploration; Reliable FPGA design;
Conference_Titel :
Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on
Conference_Location :
Boston, MA
Print_ISBN :
978-0-7695-3365-0