• DocumentCode
    3038614
  • Title

    Arbitrary Error Detection in Combinational Circuits by Using Partitioning

  • Author

    Keren, Osnat ; Levin, Ilya ; Ostrovsky, Vladimir ; Abramov, Beni

  • Author_Institution
    Bar-Han Univ., Ramat Gan
  • fYear
    2008
  • fDate
    1-3 Oct. 2008
  • Firstpage
    361
  • Lastpage
    369
  • Abstract
    The paper presents a new technique for designing a concurrently checking combinational circuit. The technique is based on partitioning the circuit into two independent sub-circuits. It does not require any redundant coding variables; instead, it utilizes a sub-set of input variables. These variables are transferred directly into a checker providing the arbitrary error detection. The paper develops and studies a method for selecting an optimized sub-set of such variables. Benchmark results show efficiency of the proposed approach.
  • Keywords
    combinational circuits; error detection; arbitrary error detection; combinational circuits; optimized sub-set; partitioning; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Fault tolerant systems; Input variables; Logic; Redundancy; Very large scale integration; combinational circuits; error detection; on-line checking; partitioning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on
  • Conference_Location
    Boston, MA
  • ISSN
    1550-5774
  • Print_ISBN
    978-0-7695-3365-0
  • Type

    conf

  • DOI
    10.1109/DFT.2008.34
  • Filename
    4641192