Title :
Built in self test for ring addressed FIFOs with transparent latches
Author :
Fenstermaker, Larry ; Kim, Ilyoung ; Lewandowski, Jim ; Nagy, Jeffrey J.
Author_Institution :
Lucent Technol., Bell Labs., USA
Abstract :
The use of special purpose complex embedded memories is becoming increasingly common. Their complex functionality, large sizes, decreasing feature sizes, and limited controllability/observability combine to make testing ever more difficult. In this paper, we describe a built in self test (BIST) method for testing ring addressed first in first out memories (FIFOs) that use transparent input latches for applications that require high data rates. The method used is compared to previous results for ring addressed FIFOs with edge triggered input latches. Several different special test modes are used to provide both more efficient and more complete BIST
Keywords :
application specific integrated circuits; built-in self test; embedded systems; integrated circuit testing; integrated memory circuits; built in self test; controllability; data rates; edge triggered input latches; feature sizes; first in first out memories; functionality; observability; ring addressed FIFOs; special purpose complex embedded memories; test modes; transparent input latches; Automatic testing; Built-in self-test; Clocks; Delay; Information retrieval; Pipelines; Propagation losses; Protection; Read-write memory; Registers;
Conference_Titel :
Memory Technology, Design and Testing, 1999. Records of the 1999 IEEE International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-0259-8
DOI :
10.1109/MTDT.1999.782686
