• DocumentCode
    3038669
  • Title

    Input-specific Dynamic Power Optimization for VLSI Circuits

  • Author

    Hu, Fei ; Agrawal, Vishwani D.

  • Author_Institution
    Intel Corp., Folsom, CA
  • fYear
    2006
  • fDate
    4-6 Oct. 2006
  • Firstpage
    232
  • Lastpage
    237
  • Abstract
    Literature proposes linear programming (LP) methods for glitch-less design of digital circuits. Considering the worst-case these methods ensure absence of glitches for any arbitrary state of primary input as well as internal signals. In this paper, we examine an unexplored aspect, i.e., glitch-free design with respect to a specific set of vectors (patterns). Introducing the logic-level concepts of glitch-generation patterns and glitch-generation probability, which are analyzable through logic simulation, we remove glitch filtering requirements from gates on which the given set of input vectors cannot produce glitches. We relax constraints of any existing LP either selectively or probabilistically. Such input-specific design from an LP model without process variation and another with process variation reduced the number of delay buffer overhead by up to 80% and 63%, respectively, while maintaining the power reduction and overall delay
  • Keywords
    VLSI; circuit optimisation; integrated circuit design; linear programming; logic design; logic simulation; LP model; VLSI circuits; digital circuits; glitch-free design; glitch-generation patterns; glitch-generation probability; glitch-less design; input-specific design; input-specific dynamic power optimization; linear programming methods; logic simulation; logic-level concepts; Analytical models; Delay; Design methodology; Digital circuits; Filtering; Linear programming; Logic; Pattern analysis; Vectors; Very large scale integration; Algorithms; Design; Input specific; dynamic power optimization; glitch reduction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Power Electronics and Design, 2006. ISLPED'06. Proceedings of the 2006 International Symposium on
  • Conference_Location
    Tegernsee
  • Print_ISBN
    1-59593-462-6
  • Type

    conf

  • DOI
    10.1109/LPE.2006.4271842
  • Filename
    4271842