Title :
Checkpointing of Rectilinear Growth in DNA Self-Assembly
Author :
Frechette, S. ; Kim, Y.B. ; Lombardi, F.
Author_Institution :
Riverside Res. Inst., Lexington, MA
Abstract :
Error detection/correction techniques have been advocated for algorithmic self-assembly. Under rectilinear growth, it requires only two additional tiles, generally referred to as Isolation tiles. This process can be effectively utilized for checkpointing and is analyzed in this paper self-assembly. Initially, the physical framework (and related features) for the removal of the erroneous sections of an assembly is outlined. A novel Markov based model is presented to establish the optimal rate of checkpointing and assess its performance versus other error tolerant techniques that utilize redundancy. Simulation results are provided.
Keywords :
DNA; Markov processes; error correction; error detection; microassembling; nanolithography; self-assembly; DNA self-assembly; Markov based model; error detection-correction techniques; error tolerant techniques; nanolithography; rectilinear growth checkpointing; Assembly; Bonding; Checkpointing; DNA; Error analysis; Error correction; Redundancy; Self-assembly; Temperature; Tiles; DNA self-assembly; checkpointing; error tolerance; tiling;
Conference_Titel :
Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on
Conference_Location :
Boston, MA
Print_ISBN :
978-0-7695-3365-0
DOI :
10.1109/DFT.2008.10