Title :
Faulty Failure Analyses
Author :
Mura, Gianluca ; Vanzi, M.
Author_Institution :
DIEE, Univ. of Cagliari, Cagliari, Italy
Abstract :
A case history of a troubled Failure Analysis (F.A.) is reported as a test for reliability of the F.A. procedure itself.
Keywords :
failure analysis; reliability; faulty failure analyses; test for reliability; troubled failure analysis; Assembly; Electrostatic discharges; Failure analysis; Image reconstruction; Integrated circuits; Light emitting diodes; Reliability;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the
Conference_Location :
Suzhou
Print_ISBN :
978-1-4799-1241-4
DOI :
10.1109/IPFA.2013.6599232
