Nanoelectronics based on scanning tunneling microscopy

Author

Louskinovich, P.N. ; Nikishin, V.I. ; Ryzhikow, I.A.

Author_Institution

NPO Mickroelectronica, Moscow, Russia

fYear

1992

fDate

19-21 Feb. 1992

Firstpage

144

Lastpage

145

Abstract

Nanotechnology focuses on research and development of recording devices with bit densities on the order of 10/sup 14/ b/cm/sup 2/ and on quantum ICs with delay times on the order of 10/sup -12/ s. The possible field interactions down to plasmon states using the complex precise control instrumentation of nanotechnology are sketched. Reversible decomposition and atom tunneling are possible. Different technological modules of nanotechnology permit operation in air, gas, liquids, and ultrahigh vacuum. Nanotechnology requires complex probe-tip control mechanisms. The basis elements of the technology system are the probe tip as the source of particles, coarse and fine positioning control of manipulators, an electronic control system, and the control of technological parameters.<>

Keywords

integrated circuit technology; nanotechnology; plasmons; scanning tunnelling microscopy; 1E-12 s; atom tunneling; bit densities; delay times; electronic control system; field interactions; nanotechnology; plasmon states; positioning control; probe-tip control mechanisms; quantum ICs; recording devices; reversible decomposition; scanning tunneling microscopy; technological parameters; technology system; Control systems; Delay; Instruments; Liquids; Microscopy; Nanoelectronics; Nanotechnology; Plasmons; Research and development; Tunneling;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference, 1992. Digest of Technical Papers. 39th ISSCC, 1992 IEEE International

Conference_Location

San Francisco, CA, USA

Print_ISBN

0-7803-0573-6

Type

conf

DOI

10.1109/ISSCC.1992.200453

Filename

200453