DocumentCode
3039864
Title
New developments in single pass reflow encapsulant for flip chip application
Author
Liu, Jean ; Kraszewski, Rich ; Lin, Xin ; Wong, Linda ; Goh, SH ; Allen, Jennifer
Author_Institution
Kester Solder-Litton Syst. Inc., Des Plaines, IL, USA
fYear
2001
fDate
2001
Firstpage
74
Lastpage
79
Abstract
This paper introduces a series of single pass reflow encapsulants that require no post curing after solder bump reflow. Acting as a flux and an encapsulant, this product performs two functions. First, the material activates the solder bump and metallic bond pad during solder reflow to establish the interconnection between the die and substrate. Second, while this material is being cured, it forms a mechanical bond between the surface of the die and substrate. This product allows processing of normal surface mount component packages concurrently with flip chip, CSPs or BGAs under the standard surface mount reflow profile. Such a process eliminates capillary underfilling and curing time. The product´s solderability is robust and high yield; the parts are reliable after thermal shock testing. We have employed DSC, TMA, DMA and shear test techniques to investigate the properties of the material. These properties include influence of filler loading level, curing reflow profile, percentage cure, glass transition temperature (Tg), coefficient of thermal expansion (CTE), modulus and die shear adhesion
Keywords
ball grid arrays; chip scale packaging; differential scanning calorimetry; elastic moduli; encapsulation; filled polymers; flip-chip devices; glass transition; integrated circuit reliability; mechanical testing; microassembling; reflow soldering; shear strength; surface mount technology; thermal expansion; thermal shock; BGAs; CSPs; CTE; DMA; DSC; TMA; capillary underfilling; coefficient of thermal expansion; curing reflow profile; curing time; die shear adhesion; die/substrate interconnection; encapsulant; filler loading level; flip chip; flip chip application; flux action; glass transition temperature; material cure; mechanical bond; metallic bond pad activation; modulus; percentage cure; post curing; process yield; shear test techniques; single pass reflow encapsulant; single pass reflow encapsulants; solder bump activation; solder bump reflow; solder reflow; solderability; standard surface mount reflow profile; surface mount component packages; thermal shock testing; Bonding; Curing; Electric shock; Flip chip; Glass; Inorganic materials; Materials testing; Packaging; Robustness; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Packaging Materials: Processes, Properties and Interfaces, 2001. Proceedings. International Symposium on
Conference_Location
Braselton, GA
Print_ISBN
0-930815-64-5
Type
conf
DOI
10.1109/ISAOM.2001.916552
Filename
916552
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