DocumentCode
3039978
Title
Cost optimization of Gamma distribution accelerated burn-in
Author
Wang, Yu ; Zhang, Xiaoqin ; Lu, Dianjun
Author_Institution
Dept. of Math. & Inf. Sci., Qinghai Normal Univ., Xining, China
fYear
2011
fDate
26-28 July 2011
Firstpage
5791
Lastpage
5794
Abstract
The burn-in process is operated under severe (stress) conditions involving high temperature, voltage, etc. and the product´s residual life depends on the burn-in stress level and the length of burn-in period. Accelerated burn-in before shipment will reject poor-quality products and improve product reliability within a warranty period. Accelerated burn-in saves time but may cost more. In this paper, our goal is to find the appropriate testing parameters to minimize the total of testing, manufacturing, quality and reliability costs. The upper and lower bounds for the optimal burn-in time are derived. It is assumed in our work that the failure pattern follows Gamma distribution and the burn-in process is operated under approximately the same environment as that of the early operating life of the product.
Keywords
failure analysis; gamma distribution; life cycle costing; life testing; optimisation; quality control; reliability; accelerated burn-in process; burn-in stress level; cost optimization; failure pattern; gamma distribution; product early operating life; product reliability improvement; product residual life; product warranty period; products quality improvement; testing parameters; Acceleration; Life estimation; Mathematical model; Reliability; Stress; Testing; Warranties; Accelerated burn-in; Cost Optimization; Gamma Distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Multimedia Technology (ICMT), 2011 International Conference on
Conference_Location
Hangzhou
Print_ISBN
978-1-61284-771-9
Type
conf
DOI
10.1109/ICMT.2011.6002564
Filename
6002564
Link To Document