• DocumentCode
    3040129
  • Title

    PWB surface finish process development to enhance the reliability of the solder joint strength

  • Author

    Watanabe, Yasuhiro

  • Author_Institution
    Ibiden Co. Ltd., Ogaki, Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    165
  • Lastpage
    170
  • Abstract
    PWBs for mobile phones have widely applied electroless nickel/immersion gold plating (EL Ni/Au) for keypads. However, the solder joint strength tends to be weak when EL Ni/Au plating is applied to the PWB pads, especially BGA/CSP pads. The fracture mode of intermetallic layers between solder and nickel is observed on weakened pads. We have been analyzing the factors of this problem, and were able to resolve it to some extent. The solder joint strength depends on the phosphorus content of the nickel film. We found that the fracture mode of the intermetallic layers appears when the phosphorus content of the nickel film is too high. We also found that the immersion gold bath condition is another factor. We have been using this information to improve our EL Ni/Au line. We have also developed a new surface finish utilizing copper, which is known to enhance the reliability of the solder ball-joint strength. The newly established surface finish consists of selectively coating OSP over those copper pads where reliability of the solder ball joint strength is needed. The EL Ni/Au is plated on keypads. We call this process “selective OSP”. This paper introduces the reliability data for solder joint strength, the design rules, and production results of selective OSP
  • Keywords
    ball grid arrays; cellular radio; chip scale packaging; circuit reliability; electroless deposition; failure analysis; fracture; interface structure; liquid phase deposition; metallisation; printed circuit design; printed circuit manufacture; printed circuit testing; surface treatment; telephone sets; BGA; CSP; Cu; EL Ni/Au; EL Ni/Au line; Ni film phosphorus content; Ni-Au; NiP; PWB pads; PWB surface finish process development; PWBs; copper; copper pads; design rules; electroless nickel; electroless nickel/immersion gold plating; fracture mode; immersion gold bath condition; intermetallic layer fracture mode; intermetallic layers; keypads; mobile phones; reliability; selective OSP finish; solder ball-joint strength; solder joint strength; surface finish; weakened pads; Coatings; Copper; Gold; Intermetallic; Mobile handsets; Nickel; Production; Soldering; Surface cracks; Surface finishing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties and Interfaces, 2001. Proceedings. International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-930815-64-5
  • Type

    conf

  • DOI
    10.1109/ISAOM.2001.916569
  • Filename
    916569