DocumentCode
3040513
Title
Application of photoelastic microscopy for researches in MEMS technology and photonics
Author
Oliinyk, O. ; Tsyganok, B. ; Serdega, B. ; Matiash, I.
Author_Institution
Dept. of Electron. Devices & Equipments, NationalTechnical Univ. of Ukraine KPI, Kiev, Ukraine
fYear
2012
fDate
9-13 May 2012
Firstpage
224
Lastpage
229
Abstract
This paper is devoted to the principles of modulation-polarization microscopy applied to surface and volume structures of solid-state materials of electronics, photonics and bioelectronics. A new setup of modulation-polarization microscope is introduced; its main advantages are speed, interference immunity, high detectivity, cheapness and simplicity of implementation. Presented method and preliminary results confirm the usability of the new photoelastic microscope for research and development of MEMS devices; micro-nano control and processing of crystal, polymers and metals surfaces and transparent volumes.
Keywords
micro-optics; micromechanical devices; nanophotonics; near-field scanning optical microscopy; photoelasticity; MEMS technology; bioelectronics; interference immunity; micro-nano control; modulation polarization microscopy; photoelastic microscopy; photonics; solid state materials; volume structures; Measurement by laser beam; Microscopy; Optical imaging; Optical microscopy; Optical modulation; Optical polarization; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Technology (ISSE), 2012 35th International Spring Seminar on
Conference_Location
Bad Aussee
ISSN
2161-2528
Print_ISBN
978-1-4673-2241-6
Electronic_ISBN
2161-2528
Type
conf
DOI
10.1109/ISSE.2012.6273077
Filename
6273077
Link To Document