• DocumentCode
    3040513
  • Title

    Application of photoelastic microscopy for researches in MEMS technology and photonics

  • Author

    Oliinyk, O. ; Tsyganok, B. ; Serdega, B. ; Matiash, I.

  • Author_Institution
    Dept. of Electron. Devices & Equipments, NationalTechnical Univ. of Ukraine KPI, Kiev, Ukraine
  • fYear
    2012
  • fDate
    9-13 May 2012
  • Firstpage
    224
  • Lastpage
    229
  • Abstract
    This paper is devoted to the principles of modulation-polarization microscopy applied to surface and volume structures of solid-state materials of electronics, photonics and bioelectronics. A new setup of modulation-polarization microscope is introduced; its main advantages are speed, interference immunity, high detectivity, cheapness and simplicity of implementation. Presented method and preliminary results confirm the usability of the new photoelastic microscope for research and development of MEMS devices; micro-nano control and processing of crystal, polymers and metals surfaces and transparent volumes.
  • Keywords
    micro-optics; micromechanical devices; nanophotonics; near-field scanning optical microscopy; photoelasticity; MEMS technology; bioelectronics; interference immunity; micro-nano control; modulation polarization microscopy; photoelastic microscopy; photonics; solid state materials; volume structures; Measurement by laser beam; Microscopy; Optical imaging; Optical microscopy; Optical modulation; Optical polarization; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology (ISSE), 2012 35th International Spring Seminar on
  • Conference_Location
    Bad Aussee
  • ISSN
    2161-2528
  • Print_ISBN
    978-1-4673-2241-6
  • Electronic_ISBN
    2161-2528
  • Type

    conf

  • DOI
    10.1109/ISSE.2012.6273077
  • Filename
    6273077