• DocumentCode
    3041223
  • Title

    Comparison of two high-end infrared thermography systems with different spectral sensitivity for thermal investigations of sensor heater elements

  • Author

    Glatz, R. ; Fulmek, P. ; Nicolics, J. ; Skerlan, S. ; Siegele, M. ; Radosavljevic, G.

  • Author_Institution
    Dept. of Appl. Electron. Mater., Vienna Univ. of Technol., Vienna, Austria
  • fYear
    2012
  • fDate
    9-13 May 2012
  • Firstpage
    107
  • Lastpage
    113
  • Abstract
    We discuss the measurement of temperature distributions using thermography, and its limitations due to wavelength and temperature dependent infrared-optical properties of the sample. A typical oxygen sensor has been realized by thick film technology: a platinum heater structure with integrated temperature sensor has been printed on a zirconia substrate. The variation of the temperature of the sensor with the applied heater current has been experimentally investigated by a three-wire resistance measurement and the application of two different high-resolution thermography systems. The first method is an easy and reliable direct method to obtain an average temperature value of the heater structure, whereas thermography gives the spatial distribution of the temperature. Thermography images of the sensor as-built and coated with a high-emissivity varnish are compared. Typical pitfalls in the interpretation of the thermal signature of the device under test resulting from unknown emission coefficients and semitransparency of the substrate material are discussed in detail.
  • Keywords
    chemical sensors; electric resistance measurement; infrared imaging; temperature distribution; temperature measurement; temperature sensors; thick film sensors; ZrO2; applied heater current; high-emissivity varnish; high-end infrared thermography systems; high-resolution thermography systems; integrated temperature sensor; oxygen sensor; platinum heater structure; sensor heater elements; spectral sensitivity; substrate material; temperature dependent infrared-optical properties; temperature distribution measurement; thermal signature; thermography images; thick film technology; three-wire resistance measurement; zirconia substrate; Coatings; Heating; Surface treatment; Temperature; Temperature measurement; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology (ISSE), 2012 35th International Spring Seminar on
  • Conference_Location
    Bad Aussee
  • ISSN
    2161-2528
  • Print_ISBN
    978-1-4673-2241-6
  • Electronic_ISBN
    2161-2528
  • Type

    conf

  • DOI
    10.1109/ISSE.2012.6273118
  • Filename
    6273118