DocumentCode :
3041345
Title :
Reliability investigation of low silver content micro-alloyed SAC solders
Author :
Krammer, Olivér ; Garami, Tamás
Author_Institution :
Dept. of Electron. Technol., Budapest Univ. of Technol. & Econ., Budapest, Hungary
fYear :
2012
fDate :
9-13 May 2012
Firstpage :
149
Lastpage :
154
Abstract :
In our research, we performed comparative analyses concerning various lead-free SAC (SnAgCu) and micro-alloyed SAC (SnAgCu+Bi+Sb) solder alloys. The mechanical properties of these solder alloys were characterized by measuring the shear strength of 0603 (1.5 × 0.75 mm) size chip resistors´ joints. We designed a testboard, which contains fifty pieces of 0603 size resistors. Thirty of them are intended for shear strength measurements and the remaining twenty are intended for cross-sectional analyses. During the experiment, twenty-eight pieces of testboards were soldered (seven with each solder alloy) and twenty-four of them are subjected to Thermal-Shock life time tests with temperature range of +125°C - -40°C up to 2 000 cycles. The shear strength of the solder joints was measured on aged samples to examine their reliability as well. The detailed results are presented in the paper.
Keywords :
ageing; antimony alloys; bismuth alloys; copper alloys; life testing; reliability; resistors; shear strength; silver alloys; solders; thermal shock; tin alloys; SnAgCuBiSb; cross-sectional analysis; low silver content microalloyed SAC solders; mechanical properties; reliability; shear strength measurements; size chip resistor joints; solder alloys; solder joints; temperature 125 degC to -40 degC; thermal-shock life time tests; Electric shock; Intermetallic; Resistors; Silver; Soldering; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Technology (ISSE), 2012 35th International Spring Seminar on
Conference_Location :
Bad Aussee
ISSN :
2161-2528
Print_ISBN :
978-1-4673-2241-6
Electronic_ISBN :
2161-2528
Type :
conf
DOI :
10.1109/ISSE.2012.6273126
Filename :
6273126
Link To Document :
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