A class of error locating codes for byte-organized memory systems

Error locating codes (EL codes), first proposed by J.K. Wolf and B. Elspas (1963), have the potential to be used to identify the faulty module for fault isolation and reconfiguration in fault-tolerant computer systems. A new class of EL codes suitable for memory systems organized with b-bit (b/spl ges/2) byte-organized semiconductor memory chips which are mounted on memory cards each having B-bit width is proposed. The proposed linear code, called S/sub b/B/EL code, identifies erroneous memory card locations containing a faulty byte-organized chip. Another important linear code proposed in this work, SEC-S/sub b/B/EL code, corrects single bit errors induced by alpha particles and, for byte errors, it locates erroneous card positions containing a faulty chip. The design methods of the proposed codes are described, and the decoding hardware and the error detection capabilities are evaluated.