Title :
Quantitative analysis of X-ray fluorescence without standard reference samples
Author :
Ji, Zhenguo ; Liang, Xiaoyong ; Xi, Junhua
Author_Institution :
Coll. of Mater. & Environ. Eng., Hangzhou Dianzi Univ., Hangzhou, China
Abstract :
X-ray fluorescence (XRF) is a non-destructive technique for elemental analysis. But the accuracy of the quantitative analysis of XRF is not as good as other techniques due to the matrix effects. In this paper, we proposed a new method by making the bulk samples into thin films with proper thickness to reduce the matrix effect, and taking into account of bremsstrahlung radiation as part of the incident X-ray intensity.
Keywords :
II-VI semiconductors; X-ray fluorescence analysis; bremsstrahlung; cadmium compounds; fluorescence; semiconductor thin films; wide band gap semiconductors; CdTe; X-ray fluorescence; XRF; bremsstrahlung radiation; elemental analysis; incident X-ray intensity; matrix effect; nondestructive method; thin films; Argon; Bismuth; Films; Fluorescence; Silicon; Solids; Matrix effect; Thin films; XRF; bremsstrahlung;
Conference_Titel :
Multimedia Technology (ICMT), 2011 International Conference on
Conference_Location :
Hangzhou
Print_ISBN :
978-1-61284-771-9
DOI :
10.1109/ICMT.2011.6002641
